Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 additional measures might need to

additional measures might need to be taken to those recommended in this standard

This standard has been written for manufacturers of health software

Television service providers

operating and maintaining the equipment in the manner prescribed by the manufacturer

and interpreting the data generated by near field scan (NFS) measurement

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 additional measures might need to1 Scope This part of IEC 60749 provides a steady state temperature and humidity bias life test for the purpose of evaluating the reliability of non hermetic packaged solid state devices in humid environments. This test method is considered destructive.