Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials Ingestion-build-51747 BS EN 61158-6-9 provides migration

BS EN 61158-6-9 provides migration paths from previously-existing industrial communications protocols

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this marking satisfies the requirements of EN 3838

high matrix tolerance

Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials Ingestion-build-51747 BS EN 61158-6-9 provides migration1 Scope This document specifies a procedure by which elemental detection limits in X ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.