Semiconductor devices. Mechanical and climatic test methods - Internal moisture content measurement and the analysis of other residual gases Ingestion-build-223009 person or body to specified

person or body to specified requirements can be substantiated by supporting documentation under the responsibility of the supplier

BS EN IEC 82079‑1:2020 includes some technical changes concerning BS EN 82079‑1:2012

in the pressure and temperature ranges covered by pressure classes and temperature types

Contents of BS EN 15626:

• Fire precautions

Semiconductor devices. Mechanical and climatic test methods - Internal moisture content measurement and the analysis of other residual gases Ingestion-build-223009 person or body to specified1 Scope This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high