M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals StdPbc-0716 2 3インチ鏡面研磨単結晶シリコンウェーハ（セカンダリフラットあり）

2 3インチ鏡面研磨単結晶シリコンウェーハ（セカンダリフラットあり）

and robotics has already been published as SEMI M74

SEMI E111-0305 (technical revision)

This Standard describes procedures for measuring adhesive strength between leadframes and molding compounds for semiconductor packages

본 에디션은 글로벌 감사 및 평가 소위원회(Audits and Reviews Subcommittee)가 2015년 1월 5일에 간행을 승인했으며 2015년 2월에 www

M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals StdPbc-0716 2 3インチ鏡面研磨単結晶シリコンウェーハ（セカンダリフラットあり）This test method was technically approved by the global Compound Semiconductor Committee and is the direct responsibility of the Japanese Compound Semiconductor Committee. Current edition approved by the Japanese Regional Standards Committee on June 1, 1999. Initially available at www. semi. org August 1999; to be published September 1999. The purpose of this document is to specify a method to measure resistivity and determine Hall mobility of semi