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D08400 - SEMI D84 - Terminology for FPD Phase Shift Mask and Mask Blanks StdPbc-1217 orgで。初版は1981年,前版は2001年11月に発行された。

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orgで。初版は1981年,前版は2001年11月に発行された。

This method outlines standard mechanical measurement techniques for cut strip leadframes

Flat Panel Display – Factory Automation Global Technical Committeeで技術的に承認されている。現版は2009年5月13日,global Audits and Reviews Subcommitteeにて発行が承認された。2009年7月にwww

1  This Specification describes a method for data acquisition EDA Applications to request process and data from equipment to be communicated in an automated fashion by the equipment

This Specification provides information for developing specifications for silicon annealed wafers used to fabricate semiconductor devices and integrated circuits

D08400 - SEMI D84 - Terminology for FPD Phase Shift Mask and Mask Blanks StdPbc-1217 orgで。初版は1981年,前版は2001年11月に発行された。This Standard defines the terminology for FPD phase shift masks and mask blanks. This Standard applies to phase shift masks and mask blanks that are principally used in fabricating flat panel displays. Referenced SEMI Standards (purchase separately) None. Revision History SEMI D84 0823 (first published)

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